A Measurement of Aluminium (Al) lonization Cross Section On K-shell;

鋁—K殼層電離截面的測(cè)量

Damaging enhancement on Inp[l00] surface induced by K-shell photoionization absorption of phosphorus or indium;

P和In原子K殼層X光吸收對(duì)InP單晶表面的損傷增強(qiáng)作用

In this paper, we give a description of recent progress on the measurements of electron-impact K-shell ionization cross-sections of atoms in the keV energy range.

首先評(píng)述了近年來(lái)該領(lǐng)域的一些研究進(jìn)展,并通過測(cè)量Cr元素在小于26keV能量范圍K殼層電離截面的例子介紹了研究組的實(shí)驗(yàn)方法。