New Virtual Instrument Measuring Torsional Vibration with A/D Technique;

基于A/D采樣技術(shù)的新型扭轉(zhuǎn)振動測量虛擬儀器

Design of A/D and D/A Converters Using Neuron MOS Transistor;

神經(jīng)MOS晶體管在A/D和D/A轉(zhuǎn)換器中的應(yīng)用

A/D Device Driver of Based on μClinux and S3C44B0X;

基于μClinux和S3C44B0X的A/D設(shè)備驅(qū)動程序的設(shè)計

Infrared Signal Simulator Based on High Speed and High Accuracy D/A;

基于高速高精度D/A的紅外信號模擬器實現(xiàn)

Realization of D/A using on-chip PWM channel in the TMS320LF2407A-based system;

基于TMS320LF2407A片內(nèi)PWM通道的D/A功能實現(xiàn)

Design of a Kind of 16～24 Resolution D/A Converters;

一種16～24位分辨率D/A轉(zhuǎn)換器的設(shè)計

Performance analysis of ARMA control chart for IID variables;

首先從歷史數(shù)據(jù)加權(quán)角度對應(yīng)用于ⅡD(independent identical distribution)變量的ARMA控制圖統(tǒng)計量進(jìn)行了分析,結(jié)果表明,ARMA統(tǒng)計量對歷史數(shù)據(jù)處理的靈活性優(yōu)于文中提到的一元控制圖,尤其是對當(dāng)前數(shù)據(jù)的處理更能適應(yīng)不同情況的需要,可以選擇不同的控制圖參數(shù)來提高控制圖檢測異常原因的能力。

The development process of procedure ⅢE of bench test , as well as its severity, accuracy and resolution are analyzed, and the correlation with procedure ⅢD is discussed.

分析了程序ⅢE臺架試驗發(fā)展的過程及其苛刻度、精密度、區(qū)分能力,并比較了與程序ⅢD臺架試驗的相關(guān)性。

This paper summarizes a basic projective inequality of D∞.

該文給出D∞的一個基本投射不等式。