Then, GOI test methodology is extended to reliability evaluation of DRAM capacitor.

同時(shí), 我們將GOI的 測(cè)試方法進(jìn)一步推廣,用于動(dòng)態(tài)存儲(chǔ)器電容可靠性評(píng)估.

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Only Mr. Green. The _ other - pple may n be _ goi - gto the bank.

只有格林? - 壬?蝗?淥?娜薩不一定去銀行.

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Numerical analysis was used to simulate the process of sapphire crystal growth by modulating temperature.

利用數(shù)值模擬分析方法,模擬了通過調(diào)節(jié)加熱溫度促進(jìn)GOI法藍(lán)寶石晶體生長(zhǎng)的過程.

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